Эллипсометрия - метод исследования поверхности / АН СССР. Сибирское отд-е. Ин-т физики полупроводников ; Отв. ред. А.В. Ржанов.
Material type:
TextPublication details: Новосибирск : Наука. Сиб. отд-ние , 1983.Description: 180 сSubject(s):
| Item type | Current library | Collection | Call number | Status | Notes | Barcode | |
|---|---|---|---|---|---|---|---|
Գրքեր / Books
|
Fundamental Scientific Library | General | PIII/51604 (Browse shelf(Opens below)) | Available | 30 Days Loan | FL0400504 |
There are no comments on this title.
Log in to your account to post a comment.
All site content, except where otherwise noted, is licensed under a