Vernon, Philip Ewart. <br/><br/>
Intelligence and attainment tests / 
Philip Ewart Vernon. 
 - London :  University of London Press,  [1960]. 
 - 207 p. :  diagrs., tables. ;  23 cm. 
<br/><br/>Bibliogr.: p. [193]-200. 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Educational tests and measurements