Механизмы образования и миграции дефектов в полупроводниках / В.С. Вавилов, А.Е. Кив, О.Р. Ниязова.
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Item type | Current library | Collection | Call number | Status | Notes | Barcode | |
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Fundamental Scientific Library | General | PII/470541 (Browse shelf(Opens below)) | Available | 30 Days Loan | FL0300925 | |
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Fundamental Scientific Library | General | PII/471666 (Browse shelf(Opens below)) | Available | 30 Days Loan | FL0299324 |
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